Automated Photovoltaic Hotspot Detection Based on IV Curve Characteristics and Machine Learning Classification

Authors

  • Imam Faried Assalam Politeknik Negeri Ujung Pandang
  • M Sahrul Ramadan Politeknik Negeri Ujung Pandang
  • Henra Jasman Politeknik Negeri Ujung Pandang
  • Ihlas Politeknik Negeri Ujung Pandang
  • Fitriani Politeknik Negeri Ujung Pandang
  • Dea Calista Politeknik Negeri Ujung Pandang

DOI:

https://doi.org/10.31963/elekterika.v23i1.5801

Keywords:

Photovoltaic, Classification, SVM, KNN, Classification, Hotspot, I-V curve, KNN, SVM

Abstract

Hotspot formation in photovoltaic (PV) modules represents a major degradation issue that reduces system efficiency, reliability, and operational lifespan. Conventional diagnostic techniques such as infrared thermography (IRT) and electroluminescence (EL) imaging provide accurate fault detection but are often constrained by high costs and limited scalability for large PV installations. To address these challenges, this study develops a machine learning-based diagnostic framework for hotspot fault classification using electrical parameters derived from IV curve analysis. Field measurements were obtained using IV curve tracers and environmental sensors, then normalized to Standard Test Conditions (STC). Two classification algorithms—Support Vector Machine (SVM) and K-Nearest Neighbor (KNN)—were employed with various kernel and distance configurations, including Linear, Quadratic, Cubic, and Gaussian kernels for SVM, as well as Euclidean, Cosine, and Weighted metrics for KNN. Model performance was evaluated through training/testing accuracy, confusion matrices, prediction speed, and classification metrics such as precision, recall, and F1-score. The Fine Gaussian SVM achieved the highest performance with 91.7% training accuracy, 95.0% testing accuracy, 97.2% recall, and an F1-score of 91.10%, demonstrating its strong capability for reliable and cost-effective hotspot diagnosis in PV systems.

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Published

2026-05-30

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